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    Ontology Based Improvement of Opening Hours in E-governments 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Communication technologies for smart metering infrastructure 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Trade space evaluation of ascent and return architectures for a Mars Sample Return mission 

    Type: Conference Paper
    Author : Alibay, F. , Bailey, Z.J.
    Publisher: IEEE
    Year: 2014

    A comparative study of in situ biosignature detection spectroscopy techniques on planetary surfaces 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    A low-power, direct RF signal sampling receiver for short range wireless devices 

    Type: Conference Paper
    Author : Bousseaud, P.; Novakov, E.; Fournier, J.-M.
    Publisher: IEEE
    Year: 2014

    Information Orchestration System for Closing the Information Retrieval Capability Gap 

    Type: Conference Paper
    Author : Kobayashi, T.
    Publisher: IEEE
    Year: 2014

    Design and development of a business simulation game application for service-based and digital economy 

    Type: Conference Paper
    Author : Pascual-Miguel, F.J.; Conde-Gonzalez, M.A.; Acquila-Natale, E.; Alvarez-Pedroviejo, R.
    Publisher: IEEE
    Year: 2014

    Effects of Substrate Thinning on the Properties of Quadruple Well CMOS MAPS 

    Type: Journal Paper
    Author : Zucca, Stefano; Manghisoni, Massimo; Ratti, Lodovico; Re, V.; Traversi, Gianluca; Bettarini, S.; Forti, F.; Morsani, Fabio; Rizzo, Gianluca
    Publisher: IEEE
    Year: 2014

    Optically Excited MOS-Capacitor for Recombination Lifetime Measurement 

    Type: Journal Paper
    Author : Elhami Khorasani, Arash; Schroder, Dieter K.; Alford, T.L.
    Publisher: IEEE
    Year: 2014

    A DDR3/4 memory link TX supporting 24–40 Ω, 0.8–1.6 V, 0.8–5.0 Gb/s with slew rate control and thin oxide output stages in 22-nm CMOS SOI 

    Type: Conference Paper
    Author : Kossel, M.; Menolfi, C.; Toifl, T.; Francese, P.A.; Brandli, M.; Morf, T.; Kull, L.; Andersen, T.M.; Yueksel, H.
    Publisher: IEEE
    Year: 2014
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