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    Do System Test Cases Grow Old? 

    Type: Conference Paper
    Author : Feldt, R.
    Publisher: IEEE
    Year: 2014

    To Celigny, in the footprints of vilfredo pareto's "optimum" [Historical Corner] 

    Type: Journal Paper
    Author : Pelosi, Giuseppe; Selleri, Stefano
    Publisher: IEEE
    Year: 2014

    Multiresponse, multiobjective calibration as a diagnostic tool to compare accuracy and structural limitations of five coupled soil plant models and CLM3.5 

    Type: Journal Paper
    Author : Wöhling, Thomas; Gayler, Sebastian; Priesack, Eckart; Ingwersen, Joachim; Wizemann, Hans; Högy, Petra; Cuntz, Matthias; Attinger, Sabine; Wulfmeyer, Volker; Streck, Thilo
    Publisher: American Geophysical Union
    Year: 2013

    Evaluation and Application of Bounded Generalized Pareto Analysis to Fault Distributions in Open Source Software 

    Type: Journal Paper
    Author : Chin-Yu Huang; Chih-Song Kuo; Shao-Pu Luan
    Publisher: IEEE
    Year: 2014

    Spectral Efficiency and Energy Efficiency of OFDM Systems: Impact of Power Amplifiers and Countermeasures 

    Type: Journal Paper
    Author : Jingon Joung; Chin Keong Ho; Sumei Sun
    Publisher: IEEE
    Year: 2014

    Mining frequent bug-fix code changes 

    Type: Conference Paper
    Author : Osman, H. , Lungu, M. , Nierstrasz, O.
    Publisher: IEEE
    Year: 2014

    Optimal power control for cooperative underlay cognitive system 

    Type: Conference Paper
    Author : Chami, M.; Pischella, M.; Le Ruyet, D.
    Publisher: IEEE
    Year: 2014

    Attaching sub-links on linear actuators of wearable robots for payload increase 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Link quality aware routing protocol for low-power and lossy networks 

    Type: Conference Paper
    Author : Wang, Sheng-Shih; Liu, Hsing-Tsai; Chen, Yen-Da
    Publisher: IEEE
    Year: 2014

    Faulty stochastic LDPC decoders over the binary symmetric channel 

    Type: Conference Paper
    Author : Kameni Ngassa, Christiane L.; Savin, Valentin; Declercq, David
    Publisher: IEEE
    Year: 2014
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