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Near-Field Scanning Microwave Microscopy: An Emerging Research Tool for Nanoscale Metrology

Type: Journal Paper

Author : Imtiaz, Al; Wallis, T.M.; Kabos, P.

Publisher: IEEE

Year: 2014

Critical Factors in Cantilever Near-Field Scanning Optical Microscopy

Type: Journal Paper

Author : Marinello, Francesco; Schiavuta, P.; Cavalli, Raffaele; Pezzuolo, Andrea; Carmignato, Simone; Savio, Enrico

Publisher: IEEE

Year: 2014

Denoising and wavelet compression of X-ray image for teleradiology

Type: Conference Paper

Author : Thakur, A.; Bhan, A.; Vyas, G.

Publisher: IEEE

Year: 2014

Author

Bhan, A. (1)

Carmignato, Simone (1)

Cavalli, Raffaele (1)

Imtiaz, Al (1)

Kabos, P. (1)

Marinello, Francesco (1)

Pezzuolo, Andrea (1)

Savio, Enrico (1)

Schiavuta, P. (1)

Thakur, A. (1)

Publisher

IEEE (3)

Year

2014 (3)

Keywords

AFM (1)

aperture configuration (1)

Apertures (1)

atomic force microscope (1)

atomic force microscopy (1)

atomic-scale device (1)

atomic-scale manipulation (1)

cantilever NSOM measurement (1)

cantilevers (1)

critical factor (1)

Type

Journal Paper (2)

Conference Paper (1)

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English (3)

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Metadata Only (3)

Publication Title

eliability, Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions), 2014 3rd (1)

Microwave Magazine, IEEE (1)

Sensors Journal, IEEE (1)

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