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Now showing items 1-8 of 8
A Test Structure to Characterize Nano-Scale Ohmic Contacts in III-V MOSFETs
Publisher: IEEE
Year: 2014
A Four-FET Method for Extracting Mobility in FETs Without Field Oxide
Publisher: IEEE
Year: 2014
Performance Analysis of Geographic Routing Protocols in Ad Hoc Networks
Publisher: IEEE
Year: 2014
Impact of FinFET and III–V/Ge Technology on Logic and Memory Cell Behavior
Publisher: IEEE
Year: 2014
A Novel Digital Etch Technique for Deeply Scaled III-V MOSFETs
Publisher: IEEE
Year: 2014
Nanometer-Scale Vertical-Sidewall Reactive Ion Etching of InGaAs for 3-D III-V MOSFETs
Publisher: IEEE
Year: 2014