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A comparison of x-lets in denoising cDNA microarray images

Type: Conference Paper

Author : Shams, R. , Rabbani, H. , Gazor, S.

Publisher: IEEE

Year: 2014

Author Index

Type: Conference Paper

Publisher: IEEE

Year: 2014

[Title page iii]

Type: Conference Paper

Publisher: IEEE

Year: 2014

Disturbance characteristics analysis of CMG due to imbalances and installation errors

Type: Journal Paper

Author : Yao Zhang; Jingrui Zhang

Publisher: IEEE

Year: 2014

Dynamic brush placement of large DC machines in mining industry — A feasibility study

Type: Conference Paper

Author : Boulter, Michael; Alahakoon, Sanath

Publisher: IEEE

Year: 2014

Improving Flash memory endurance and consumption with ultra-short channel-hot-electron programming pulses

Type: Conference Paper

Author : Postel-Pellerin, J.; Chiquet, P.; Della Marca, V.; Wakrim, T.; Just, G.; Ogier, J.L.

Publisher: IEEE

Year: 2014

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Type: Conference Paper

Publisher: IEEE

Year: 2014

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A comparison of x-lets in denoising cDNA microarray images

Author Index

[Title page iii]

Disturbance characteristics analysis of CMG due to imbalances and installation errors

Dynamic brush placement of large DC machines in mining industry — A feasibility study

Improving Flash memory endurance and consumption with ultra-short channel-hot-electron programming pulses

[Blank page]

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A comparison of x-lets in denoising cDNA microarray images

Author Index

[Title page iii]

Disturbance characteristics analysis of CMG due to imbalances and installation errors

Dynamic brush placement of large DC machines in mining industry &#x2014; A feasibility study

Improving Flash memory endurance and consumption with ultra-short channel-hot-electron programming pulses

[Blank page]

Dynamic brush placement of large DC machines in mining industry — A feasibility study